Interoperability testing remains one of the most time consuming aspects of device validation on the physical layer, a factor only compounded as increasing speeds bring with them increased complexity. To keep up with this rising complexity, the Common Management Interface Specification (CMIS) – crucial to ensuring devices from different vendors can all work together – has only grown since its inception. With the ever-present goal of keeping the cost of test low without compromising coverage, a novel approach to interoperability testing is required.
In this webinar, MultiLane explores interoperability testing challenges, providing a comprehensive look at validation: from factors that styme module bring-up, to ensuring smooth communication between host and module, reducing the time spend validating CMIS implementation, and facilitating module provisioning with access to Apsel codes.
Alongside these challenges, MultiLane demonstrates real time solutions using the purpose-built Nexus analyzer. SM and DPSM tests, vcc/inrush current measurements, full CMIS register validation and I2C Captures and Analysis, are some of the features used to show how automated test solutions can streamline interop testing.
Presenter: Sana Awar (Product Marketing Engineer, MultiLane)
